Patent · US Expired

Strain gage having a thin discontinuous metal layer

US4812800A · kind A · utility

8Cited by

2References

10Claims

0Family size

Assignee

BASF SE

Inventors

Harald Fuchs · Eisenberg (Pfalz), DE
Herbert Gleiter · Karlsruhe, DE
Stephan Trapp · Friedrichsthal, DE
Juergen Petermann · Buxtehude, DE

Key dates

Filing date	Feb 5, 1987
Grant date	Mar 14, 1989
Priority date	—
Expiry date	Feb 5, 2007

Classification

Technology area (CPC H)Electricity
CPC primaryH01C10/10
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A highly sensitive strain gage containing a thin discontinuous metal layer whose conduction effect is based predominantly on the tunnel effect and which is applied uniformly onto a thin, nonmetallic, dielectric or semiconducting substrate such as uniaxially oriented or partially crystalline plastic film, an ordered ultrathin layer or a silicone-coated plastic film, the diffusion processes in the applied metal layer being reduced and its structural stability improved as a result of interaction of the substrate with the metal layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.