Apparatus and methods for measuring permittivity in materials
US4814690A · kind A · utility
56Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 2, 1987 |
| Grant date | Mar 21, 1989 |
| Priority date | — |
| Expiry date | Oct 2, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Devices and analytical techniques are disclosed for measuring the spatial profile of permittivity of a material by multiple wavenumber interrogations. Electrode structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporary frequency ".omega.") from the electrode structures are attenuated to varying degrees by the material undergoing analysis, depending upon the wavenumber ("k"), thereby permitting the derivation of a composite dielectric profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.