Device for testing components of transparent material for surface irregularities and occlusions
US4815844A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 1987 |
| Grant date | Mar 28, 1989 |
| Priority date | — |
| Expiry date | Jun 15, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for testing components of transparent material for surface irregularities and occlusions which comprises a mechanism for rotatably mounting the component so that the component may be rotated on its axis; a mechanism for generating a light ray which moves linearly so that the light ray can dot-scan the component along a diameter of the component; at least one signal generating device disposed at a predetermined angle to the direction of impingement of the light ray for detecting surface irregularities and occlusions of the component and then generating a signal representative of the irregularity or occlusion; and a signal evaluation device for evaluating the signals produced in the signal generating device. The signal generating device comprises an image forming optical system; an interchangeable mask disposed at the focal plane of the image forming optical system for selecting the image of a plane of the component; and a receiver for receiving the light rays passing the mask and generating a signal representative of the light rays received.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.