Patent · US Expired

Device for testing components of transparent material for surface irregularities and occlusions

US4815844A · kind A · utility

25Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 15, 1987
Grant dateMar 28, 1989
Priority date
Expiry dateJun 15, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/1045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device for testing components of transparent material for surface irregularities and occlusions which comprises a mechanism for rotatably mounting the component so that the component may be rotated on its axis; a mechanism for generating a light ray which moves linearly so that the light ray can dot-scan the component along a diameter of the component; at least one signal generating device disposed at a predetermined angle to the direction of impingement of the light ray for detecting surface irregularities and occlusions of the component and then generating a signal representative of the irregularity or occlusion; and a signal evaluation device for evaluating the signals produced in the signal generating device. The signal generating device comprises an image forming optical system; an interchangeable mask disposed at the focal plane of the image forming optical system for selecting the image of a plane of the component; and a receiver for receiving the light rays passing the mask and generating a signal representative of the light rays received.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.