Method and apparatus for measuring strong microwave electric field strengths
US4816634A · kind A · utility
Inventors
Key dates
| Filing date | Oct 23, 1987 |
| Grant date | Mar 28, 1989 |
| Priority date | — |
| Expiry date | Oct 23, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0878
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring strong microwave electric field strengths is disclosed. The apparatus includes a first active temperature probe in cooperation with susceptor means for measuring a temperature indicative of the heating effects of microwave radiation at a test location, and an ambient temperature probe for measuring ambient temperature. The temperature differential between the two probes is used by calibration means for determining electric field strength at the test location. The method includes the steps of heating a susceptor means with microwave radiation, and measuring a temperature indicative of the heating effects of microwave radiation at the test location. Ambient temperature is measured, and the temperature differential used to determine the magnitude of the electric field strength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.