Patent · US Expired

Wall thickness detector

US4820972A · kind A · utility

16Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 2, 1987
Grant dateApr 11, 1989
Priority date
Expiry dateJul 2, 2007

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB07C5/3408
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A capacitive probe for a wall thickness detector comprises a plurality of flexible capacitive elements and an elastomeric body supporting the flexible capacitive elements and biasing them against a dielectric body at an inspection site. A first metallic shield is supported between the elastomeric body and the capacitive elements and a second metallic shield is supported on the other side of the capacitive elements in close proximity thereto and has a window to expose the capacitive elements to the dielectric member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.