Method and apparatus for transient unit cell measurement
US4821302A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 29, 1988 |
| Grant date | Apr 11, 1989 |
| Priority date | — |
| Expiry date | Feb 29, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus is disclosed for measuring the lattice parameters of single crystal material while that material is undergoing a transient shock wave. In a first embodiment, a first target is located at a preselected position in space with respect to a single crystal to be measured. A first laser beam pulse is transmitted through a beam block to the crystal to produce a transient shock wave in part of the crystal. A second laser beam pulse, synchronized to the first laser beam pulse, is transmitted to the first target to cause the first target to produce first and second sets of x-rays which are Bragg-diffracted from shocked and unshocked atomic planes of the crystal as the crystal is undergoing the shock wave. A first x-ray detector records the positions of the first and second sets of Bragg-diffracted x-rays to provide a first measurement of the lattice parameters of the crystal. In a second embodiment, a third laser beam pulse, synchronized to the second laser beam pulse, is transmitted to a second target to cause the second target to produce third and fourth sets of x-rays which are Bragg-diffracted from shocked and unshocked atomic planes of the crystal as the crystal i…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.