Apparatus for clamping a test sample in a testing machine
US4821579A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 1988 |
| Grant date | Apr 18, 1989 |
| Priority date | — |
| Expiry date | Jun 16, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0623
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a test sample clamping apparatus for testing machines, having a clamping head or chuck and a force sensor (2) arranged on the chuck, testing forces are measured with a force sensor and displacements or test sample deformations are measured simultaneously with a light deflection. Thus, rapid test procedures such as fast tensile rupture tests are made possible. The clamping head or chuck includes a base plate (3), one side of which receives or holds clamping elements (15) and the other side of which clamps down the force sensor (2) against a support. A mirror surface (8, 8') is arranged on the base plate (3) or on other appropriate surfaces of the clamping head so as to reflect a ligth beam (10) emitted by a light source (9) onto a position detector (11). In order to measure a deformation caused displacement of the clamping head and correspondingly of the test sample (4), an electronic evaluating circuit (12) evaluates the position dependent output signal of the detector (11).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.