Patent · US Expired

Apparatus for clamping a test sample in a testing machine

US4821579A · kind A · utility

4Cited by
3References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 16, 1988
Grant dateApr 18, 1989
Priority date
Expiry dateJun 16, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0623
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a test sample clamping apparatus for testing machines, having a clamping head or chuck and a force sensor (2) arranged on the chuck, testing forces are measured with a force sensor and displacements or test sample deformations are measured simultaneously with a light deflection. Thus, rapid test procedures such as fast tensile rupture tests are made possible. The clamping head or chuck includes a base plate (3), one side of which receives or holds clamping elements (15) and the other side of which clamps down the force sensor (2) against a support. A mirror surface (8, 8') is arranged on the base plate (3) or on other appropriate surfaces of the clamping head so as to reflect a ligth beam (10) emitted by a light source (9) onto a position detector (11). In order to measure a deformation caused displacement of the clamping head and correspondingly of the test sample (4), an electronic evaluating circuit (12) evaluates the position dependent output signal of the detector (11).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.