Systems for the direct analysis of solid samples by atomic emission spectroscopy
US4824249A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 1987 |
| Grant date | Apr 25, 1989 |
| Priority date | — |
| Expiry date | Dec 1, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/283
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analysis system for directly analyzing solid samples by atomic emission spectroscopy wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountably located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.