Echometer for locating defects which affect light conductors
US4826314A · kind A · utility
6Cited by
1References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 28, 1982 |
| Grant date | May 2, 1989 |
| Priority date | — |
| Expiry date | Jun 28, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An echometer which translates an optical signal into the centimetric or decimetric wave bands. A test signal and the local oscillator signal are provided by a single laser oscillator. The test signal and the local oscillator signal, which are 90.degree. different in phase, are modulated at centimetric or decimetric frequencies, and detected by mixing echo signals and the local oscillator signal with a photodiode or the like.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.