Polysilicon pattern for a floating gate memory
US4829351A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 16, 1987 |
| Grant date | May 9, 1989 |
| Priority date | — |
| Expiry date | Mar 16, 2007 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/12528
Abstract
An integrated circuit floating gate memory is formed using two layers of polysilicon. The first layer of polysilicon is patterned twice, once before the second polysilicon layer is deposited, and again as part of the etch of the second layer of polysilicon. Stringers of the second layer of polysilicon can form along the edge of the first etch of the first layer of polysilicon. The first etch of the first layer of polysilicon is patterned so that even if these stringers are subsequently formed, there is no harm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.