Patent · US Expired

Methods and apparatus for customizing and testing fully assembled postage meters

US4837714A · kind A · utility

24Cited by
4References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 1987
Grant dateJun 6, 1989
Priority date
Expiry dateDec 28, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG07B2017/00322
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Methods and associated apparatus are disclosed for customizing and testing fully assembled postage meters in a secure manner. According to the invention, meters are customized under external, i.e. non-meter resident, program control. The external program control may be used to initialize meters, produce "blank" (unconfigured) meters, and configure either blank or previously configured meters, both at the factory and in the field. The ability to reconfigure fully assembled meters permits devices which have been put into service in one country to be easily reconfigured by authorized personnel, and placed into service in another country. The invention customizes meters in a manner that is transparent to the operator, maxmimizing the security of sensitive meter data by minimizing operator handling and access to such data. The invention also facilitates the "non-destructive" testing of fully assembled meters, i.e. meters need not be taken apart to, for example, analyze failures where a risk of losing data may result from disassembly. In addition, by minimizing the amount of resident meter software required to perform secure customization, the invention optimizes the use of internal mete…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.