Patent · US Expired

Apparatus for measuring reflectivity

US4838695A · kind A · utility

21Cited by
11References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 1987
Grant dateJun 13, 1989
Priority date
Expiry dateJun 12, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/218
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measuring the reflectivity of magnetooptic materials where the complex reflection coefficients of absorbing anisotropic media are determined. Amorphous rare-earth transition metal alloys exhibiting polar Kerr effect are analyzed for use as storage media in erasable optical storage systems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.