Noncontact temperature pattern measuring device

US4840496A · kind A · utility

Assignee

• The United States of America as represented by the Administrator of the National Aeronautics and Space Administration · US

Inventors

• Daniel D. Elleman · San Marino, US
• James L. Allen · Greenville, US
• Mark C. Lee · Poway, US

Key dates

• Filing date: Feb 23, 1988
• Grant date: Jun 20, 1989
• Expiry date: Feb 23, 2008

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2005/0077
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Laser pyrometer techniques are utilized to accurately image a true temperature distribution on a given target without touching the target and without knowing the localized emissivity of the target. The pyrometer utilizes a very high definition laser beam and photodetector, both having a very narrow focus. The pyrometer is mounted in a mechanism designed to permit the pyrometer to be aimed and focused at precise localized points on the target surface. The pyrometer is swept over the surface area to be imaged, temperature measurements being taken at each point of focus.