Device for measuring flatness defects in a strip
US4841767A · kind A · utility
4Cited by
5References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 2, 1987 |
| Grant date | Jun 27, 1989 |
| Priority date | — |
| Expiry date | Dec 2, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/287
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring flatness defects in a strip (15), e.g., rolled metal sheets, by the use of sensors. The voltage is measured within an amplitude measuring interval smaller than the voltage variation interval after the pulse, each sensor is associated with a correction transformer (7) capable of delivering on each energizing pulse an adjustable correction voltage (U2) algebraically added to the voltage (U1) at the terminals of the secondary winding (42) of the sensor and whose value, at the instant of measurement, is determined so as to bring the measured voltage (U3) within the measurement interval of the converter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.