Patent · US Expired

Apparatus for detecting the position of incidence of a beam of charge carriers on a target

US4843246A · kind A · utility

17Cited by
5References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 3, 1987
Grant dateJun 27, 1989
Priority date
Expiry dateDec 3, 2007

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K15/0013
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The invention concerns apparatus for detecting the position of incidence (2) of a beam (1) of charge carriers on a target (3) wherein X-rays (4) starting from the position of incidence (2) are detected by detector (7) connected to an analyzing circuit (9) An imaging system (5, 50; 10, 11, 12) is provided which can cover all the positions (P.sub.1 . . . P.sub.8) that the positions of incidence (2) can take up and projects them on the sensing surface of a position-sensitive detector (7), wherein the projected coordinates (x', y') are directly proportional to the coordinates (x, y) of the position of incidence (2). In addition, a filter (6) highly transparent to the X-ray radiation range emitted from the position of incidence (2) is arranged between the target surface (3) and the position-sensitive sensor (7). The position-sensitive detector (7) emits electric signals which depend from the coordinates (x, y) of the position of incidence (FIG. 1).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.