Test method for LCD elements
US4843312A · kind A · utility
35Cited by
15References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 1988 |
| Grant date | Jun 27, 1989 |
| Priority date | — |
| Expiry date | Mar 29, 2008 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S345/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Picture electrodes of an LCD semi-manufactured product in which normal addressing is not possible are scanned by means of an electron beam (7) in order to test the associated switching elements (13, 20). In a different type of LCD semi-manufactured product the quality of the switching elements (23, 24) can be monitored by means of irradiation with a laser beam (5).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.