Method for measuring a three-dimensional position of an object
US4846576A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 1986 |
| Grant date | Jul 11, 1989 |
| Priority date | — |
| Expiry date | May 20, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/46
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring a three-dimensional position of an object with a single camera and a multislit light, i.e., a source of multiplanar light beams. A surface of the object is irradiated with multislit lights, i.e., multiplanar light beams, having a plurality of slit light faces and also irradiated with a single standard slit light having a slit light face identical to one of the plurality of slit light faces of the multislit lights. A plurality of slit light photo images corresponding to a plurality of slit light projected images and a standard slit light photo image corresponding to a slit light projected image formed on the object are obtained. One of the slit light photo images which corresponds to the standard slit light photo image is specified and made to correspond, to compute a three-dimensional position of the object in a predetermined coordinate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.