Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser
US4847495A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 17, 1988 |
| Grant date | Jul 11, 1989 |
| Priority date | — |
| Expiry date | Mar 17, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an accurate method of quantitative analysis by the quantitative determination of the mean atomic number of phases containing two light elements or one light element combined with heavy elements using a scanning microscope connected to an image analyser of the intensity of the back-scattered electrons. This method of quantitative analysis by the quantitative determination of the mean atomic number (Z.sub.1) with a precision of .+-.0.1 unit of an unknown phase present in the plane micrographic section of a sample, containing either two light elements (3.ltoreq.Z.ltoreq.11) or at least one heavy element (Z>12) and a single light element (3.ltoreq.Z.ltoreq.11) using a scanning electron microscope comprising analyser X coupled to an image analyser, the image analyser allowing the local intensity of the back-scattered electrons to be measured by the level of greyness (G) of the corresponding image, this method involving, under given operation conditions: PA1 (a) determination of the calibration curve G=f (Z) by means of a known samples, PA1 (b) determination of the level of greyness (G.sub.1) of the unknown phase under consideration, PA1 (c) determination of (Z.s…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.