Patent · US Expired

Apparatus and method for regulating temperature in a cryogenic test chamber

US4848093A · kind A · utility

115Cited by
8References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 15, 1988
Grant dateJul 18, 1989
Priority date
Expiry dateSep 15, 2008

Classification

  • Technology area (CPC F)Mechanical Engineering; Lighting; Heating
  • CPC primaryF17C2260/02
  • WIPO fieldMechanical elements
  • WIPO sectorMechanical engineering

Abstract

An apparatus and method for regulating the temperature in a cryogenic test chamber. Liquid helium is drawn into a test chamber located in a cryogenic vessel through a capillary tube which is spaced apart from the test chamber. The capillary tube is thermally insulated from the liquid helium. In a high temperature mode, a heater element heats the capillary tube to a temperature just high enough to boil the liquid helium as the helium is drawn through the capillary tube into the test chamber, thereby insuring that only gaseous helium enters the test chamber and preventing any tendency of the temperature in the test chamber to oscillate when the test chamber is warmed to temperature only slightly higher than the temperature of the liquid helium. In a low temperature mode the heater element heats the capillary tube sufficiently to substantially prevent any helium from flowing into the test chamber, thereby facilitating cooling of the test chamber to temperature below the temperature of the liquid helium by evacuating the test chamber until the liquid therein boils at the desired temperature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.