Patent · US Expired

Charged particle analyzer

US4849629A · kind A · utility

9Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 1987
Grant dateJul 18, 1989
Priority date
Expiry dateNov 13, 2007

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/488
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A charged particle analyzer comprises a spherical grid, a spherical electrode, a screen plate, and a detector. The spherical electrode is outside of the spherical grid and is concentric with the spherical grid. The screen plate has an entry window and an exit opening, which are symmetrical with the center of the sphere of the spherical grid. A sample is disposed at the entry window of the screen plate. The detector is positioned behind the exit opening to detect charged particles emitted from the sample. The charged particles having the same energy can travel through the exit opening of the screen plate, and their amount or their angular distribution is measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.