Method of measuring and displaying double refraction occurring in a material to be measured
US4850710A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 1987 |
| Grant date | Jul 25, 1989 |
| Priority date | — |
| Expiry date | Sep 25, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/23
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method of measuring and displaying double refraction. In this method measuring light which has been subjected to double refraction passes through the material to be measured at a point of measurement thereof. A surface of the material to be measured is disposed in a manner that the same is located at right angles, or is inclined with respect to an optical axis of the measuring light. The material is rotated about the point of measurement thereof on a plane which is perpendicular to the optical axis of the measuring light. The data on the double refraction is displayed together with a plus or minus sign thereof as a function of the angle of rotation, in the form of polar coordinates corresponding to the angle of rotation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.