Detachable high-speed opto-electronic sampling probe
US4851767A · kind A · utility
32Cited by
12References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 15, 1988 |
| Grant date | Jul 25, 1989 |
| Priority date | — |
| Expiry date | Jan 15, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing or sampling probe to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate though which optical pulses are focused or directed onto a photoconducting gap. The probe further includes a transmission line associated with the photoconductive gap, and which terminates at a tapered end of the probe in contacts which are placed on the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.