Apparatus for measuring circuit parameters of a packaged semiconductor device
US4853628A · kind A · utility
37Cited by
5References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 10, 1987 |
| Grant date | Aug 1, 1989 |
| Priority date | — |
| Expiry date | Sep 10, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor device includes as part of the integrated circuit thereof a test structure which allows testing of the semiconductor device through the device pins, to allow adjustment of various parameters of the circuit if desired for obtainment of optimum performance, and with the circuit being operable under normal conditions without degradation in relation to its optimum design situation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.