Apparatus and process for improved detection limits in mass spectrometry
US4855594A · kind A · utility
18Cited by
8References
37Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 2, 1988 |
| Grant date | Aug 8, 1989 |
| Priority date | — |
| Expiry date | Mar 2, 2008 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/24
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A system and method for detecting trace levels of a sample gas in a mass spectrometer having a vacuum chamber with a vacuum pump, an ionizer, extracting and imaging lens and a detector. A high pressure sample gas pulse is introduced into the vacuum chamber through a small orifice to produce a high density of sample gas in a region near the orifice. The density of the sample gas pulse is sufficient to substantially sweep residual background gas from the path of the pulse. A portion of the sample gas pulse is ionized and ions are extracted and imaged.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.