Apparatus for examining objects
US4858156A · kind A · utility
12Cited by
10References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 22, 1986 |
| Grant date | Aug 15, 1989 |
| Priority date | — |
| Expiry date | Apr 22, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for examining the shape and/or dimensions of an object wherein an object is fed to a test station (12) on a stepping conveyor (14), the object is illuminated within the test station and scanned by two linear charge-coupled camera devices (18, 20) acting in mutually perpendicular directions across and along the conveyor. Logic circuitry processes the video signals to provide raw measurement signals fed into a microprocessor for analyzing the signals and for providing control signals for a downstream reject mechanism.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.