Patent · US Expired

Multipurpose socket

US4859189A · kind A · utility

33Cited by
11References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 8, 1988
Grant dateAug 22, 1989
Priority date
Expiry dateJul 8, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0475
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test socket for testing chips and chips on tape wherein the test socket is formed on a heat resistant dielectric film having contact pads and connector pads joined by metallic circuit traces and which film is wrapped on a compliant pad. The connector end of the tape is joined to a circuit board by a conductive tape and maintained in contact by the compliant pad. A frame registers the chip with the contact area of the tape.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.