Apparatus and method for testing impedances of interconnect devices
US4859952A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 28, 1987 |
| Grant date | Aug 22, 1989 |
| Priority date | — |
| Expiry date | Dec 28, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/66
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In electronic devices, such as data processing systems that operate at high frequencies, the integrity of the interconnect or coupling apparatus transferring signals between component modules is critical to prevent compromise of information being transferred. However, the interconnect or coupling apparatus is subject to both long term and to short term impedance variations. Apparatus is disclosed for testing both the long term impedance changes and the rapid fluctuations that are not observable by current testing procedures. In addition, apparatus is disclosed for providing controllable rapid impedance changes to verify the operation of test apparatus, disclosed herein, for measuring the rapid impedance changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.