Patent · US Expired

Method for forming deposited film by generating precursor with halogenic oxidizing agent

US4861623A · kind A · utility

3Cited by
39References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 1986
Grant dateAug 29, 1989
Priority date
Expiry dateDec 16, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32053
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a deposited film comprises introducing a gaseous starting material containing silicon and/or germanium atoms; a starting material containing at least one member selected from the group consisting of aluminum (Al), molybdenum (Mo), tungsten (W), titanium (Ti), and tantalum (Ta), which is capable of being converted to gaseous state; and a gaseous halogenic oxidizing agent which exerts an oxidative effect on the said starting materials for film formation, into a reaction space to effect contact therebetween to thereby chemically form a plural number of precursors containing precursors under excited state, and forming a deposited film on a substrate existing in a film-forming space by the use of at least one precursors of said percursors as the feeding source for the constituent element of the deposited film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.