Method and system for dual phase scanning acoustic microscopy
US4866986A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 15, 1988 |
| Grant date | Sep 19, 1989 |
| Priority date | — |
| Expiry date | Sep 15, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/0681
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a scanning acoustic microscope of the reflection type, in which an object is insonified with a series of ultrasonic acoustic pulses in accordance with a preselected scanning pattern and reflected acoustic echo pulses are received and employed to generate an initial electrical signal comprising a sequence of electrical pulses having amplitudes and polarities representative of the magnitudes and phases of the echoes, a directly readable unified interpretative display image is produced from the entire electrical signal; that image includes the usual scanning position and depth information determined by timing of the electrical pulses, together with complete transition information regarding the nature of acoustic impedance changes, based on both the amplitudes and the polarities of those pulses. A compared dual integration method and system, with related gating and display enhancement techniques, comprises the preferred embodiment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.