Methods and apparatus for frequency response analysis
US4868494A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 1988 |
| Grant date | Sep 19, 1989 |
| Priority date | — |
| Expiry date | Feb 8, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a frequency response analyser for operation at high frequencies a signal of frequency F for application to a system under test (15) is generated from a frequency synthesizer (11) capable of operation only at a relatively lower frequency F/K by generating a first signal (19) of frequency at the relatively lower frequency F/K by generating a second signal 104 at the relatively higher frequency (f+F) and generating a third signal (at 114) or F(1--1/K). The second signal is applied to the system under test and an output signal (at 16) derived therefrom. The output is multiplied by the third signal to provide a product signal, and the product signal is analyzed with respect to first signal by means of a correlator 14. The present invention overcomes the limitation in maximum testing frequency imposed by the frequency synthesizers of prior art frequency response analyzers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.