X-ray scanner with secondary radiation detector
US4870670A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 5, 1988 |
| Grant date | Sep 26, 1989 |
| Priority date | — |
| Expiry date | Oct 5, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.