Method and apparatus for ultra high frequency spectrum analysis
US4871232A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 1987 |
| Grant date | Oct 3, 1989 |
| Priority date | — |
| Expiry date | Dec 7, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/17
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A high frequency spectral analysis system and method operates by modulating an optical beam with a high frequency signal to be analyzed, and sampling the beam simultaneously at periodically spaced locations along its length. The sampled portions are then focused to a spectral mapping. In the preferred embodiment a beam is directed in a zigzag pattern through a plate, one surface of which is totally reflective and the opposite surface of which is partially reflective. Periodic parallel samples are obtained from the minor portions of the beam which are transmitted out of the plate through the partially reflective surface. The totally reflective surface is preferably formed as a series of cylindrical surfaces which focus the beam to small spots at the partially reflective surface, thereby permitting a higher spatial density of samples without overlapping. The plate thickness is selected so that the beam is sampled at the Nyquist rate for the highest frequency contained in the signal of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.