Environmental testing facility for electronic components
US4871965A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 18, 1988 |
| Grant date | Oct 3, 1989 |
| Priority date | — |
| Expiry date | Aug 18, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2862
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An environmental testing facility for verifying operational conditions of electronic components at predefined temperature extremes is described. A removable multistation holder is configured to have a plurality of components coupled thereto. The multistation holder is coupled to a controllable, rotatable shaft. A hood is placed over the holder, shaft and associated apparatus and placed in contact with a base plate, so that a vacuum can be established in the resulting chamber. A sensing device permits the positioning of the individual components with respect to an interface apparatus. When the component is correctly positioned with respect to the interface apparatus, the interface apparatus is moved to engage the terminals of the components. The electrical signals can be applied to and received from the component through the interface device. After a first temperature condition is established for the multistation holder and consequently for the components coupled thereto, all of the components are tested. Thereafter, the components are tested at the second temperature condition. The testing apparatus is operated under control of data processing circuits that can apply and receive si…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.