Method and apparatus for measuring a three-dimensional curved surface shape
US4874955A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 1988 |
| Grant date | Oct 17, 1989 |
| Priority date | — |
| Expiry date | Oct 17, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2441
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus adapted to measure a three-dimensional curved surface shape quantitatively with high speed. A pattern of interference fringes on a surface of an object to be measured is picked up so that while moving a reference plane (or the object to be measured) in the direction of an optical axis, the resulting video signal is processed to form a composite image in which a value of each of picture elements is represented by a position of the reference plane (or a position of the object to be measured) at an instant that one of positions on the object surface corresponding to that picture element in the image attains a maximum brightness. Then, a three-dimensional curved surface shape of the object to be measured is measured on the basis of the composite image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.