Noise measurement probe
US4879507A · kind A · utility
Assignees
Inventor
Key dates
| Filing date | Dec 23, 1988 |
| Grant date | Nov 7, 1989 |
| Priority date | — |
| Expiry date | Dec 23, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for providing noise measurements of an electrical circuit includes at least one loop of wire connected to a plurality of conductors. The loop interconnects one or more signal-carrying ones of the conductors to one or more of the conductors carrying ground and has a portion which is substantially straight or is deformable to follow the path of a conductor in the electrical circuit. Preferably, the loop is formed so that this straight portion terminates in a right angle bend at each end. This loop serves as an inductive pickup which avoids the need for contact of the probe to the circuit under test and, thereby, provides more accurate noise measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.