Semiconductor test system
US4888715A · kind A · utility
13Cited by
7References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 19, 1985 |
| Grant date | Dec 19, 1989 |
| Priority date | — |
| Expiry date | Nov 19, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor test system comprises an expected value storage area for storing expected values of output data supplied from a semiconductor device under test, a memory device for storing output data directly supplied from the semiconductor device under test in the form of the identical code with that of the expected value storage area, and a comparator for comparing output data from the memory device directly with expected values from the expected value storage area without any conversion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.