Device for testing and sorting electronic components, more particularly integrated circuit chips

US4889242A · kind A · utility

Assignee

• Multitest Elektronische Systeme GmbH · DE

Inventors

• Hans-Heinrich Willberg · Naila, DE
• Ekkehard Ueberreiter · Zorneding, DE

Key dates

• Filing date: May 28, 1986
• Grant date: Dec 26, 1989
• Expiry date: May 28, 2006

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2893
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts. The contact movement is initiated by the components here, while the test contacts are fixed. For this purpose, the components are displaced into the test channel crosswise to the direction of transportation. A shuttle is arranged between t…