Photo ion spectrometer
US4889987A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 13, 1987 |
| Grant date | Dec 26, 1989 |
| Priority date | — |
| Expiry date | Feb 13, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/484
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A charged particle spectrometer for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.