Apparatus for testing an integrated circuit device
US4893072A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 22, 1988 |
| Grant date | Jan 9, 1990 |
| Priority date | — |
| Expiry date | Jun 22, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An IC tester for testing an IC device having clocked circuits operative to process a signal under control of a clock signal with a time delay shift comprises a generator for generating a test signal to be supplied to the IC device under control of a timing signal having a repetition period equal to the period of the clock signal, a generator for generating an expected signal to be hopefully delivered from the IC device in response to the test signal, a shifting circuit for effecting a time delay shift of the expected signal equal to the time delay shift in the clocked circuits in the integrated circuit device, and a comparator for comparing the output signal of the IC device responsive to the test signal with the expected signal delivered through the shifting circuit to thereby determine performance characteristics of the IC device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.