Patent · US Expired

Integrated circuit signature analyzer for testing digital circuitry

US4897842A · kind A · utility

52Cited by
15References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 5, 1987
Grant dateJan 30, 1990
Priority date
Expiry dateNov 5, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/277
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system for testing digital circuitry includes a signature generator that is connected to a plurality of nodes in the circuit to be tested and that generates signature words unique to identical streams of binary data signals or clocking signals. A multiplexer sequentially directs streams of signals to the signature generator from selected test nodes, or data streams from a plurailty of nodes can be signaturized simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.