Patent · US Expired

Sputtering method and apparatus

US4902394A · kind A · utility

22Cited by
7References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 20, 1988
Grant dateFeb 20, 1990
Priority date
Expiry dateJan 20, 2008

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C14/548
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A sputtering method and apparatus for use in forming thin films on a substrate. The power output of a sputtering power source is periodically changed to a high level power and a low level power, and each film is deposited to a thickness corresponding to the integrated value of the high level power, whereby a desired thickness can be obtained in any of multilayer films having mutually different film thickness ratios.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.