Semiconductor integrated circuit having a DC test function
US4904883A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Dec 1, 1988 |
| Grant date | Feb 27, 1990 |
| Priority date | — |
| Expiry date | Dec 1, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31701
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit receiving an input signal and producing output signal including: a set/reset circuit, operatively connected to an internal main circuit, being set in response to the first signal and reset in response to the second signal in a normal mode; an output buffer circuit, connected to the set/reset circuit, for producing the output signal in response to an output of the set/reset circuit; and a control circuit, connected between the internal main circuit and the set/reset circuit, receiving the first signal, a reset signal for initializing the internal main circuit, the first signal, the second signal, and a first test signal, during a DC test mode, the control circuit resetting the set/reset circuit in response to a receipt of the reset signal regardless of the second signal and setting the set/reset circuit in response to a receipt of the first test signal regardless of the reset signal and the first signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.