Optical profile measuring apparatus
US4906098A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 9, 1988 |
| Grant date | Mar 6, 1990 |
| Priority date | — |
| Expiry date | May 9, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring the profile of portions of an article located within a predefined plane. Each portion is scanned, such as by an optical micrometer providing a beam of radiant energy, to determine its dimension. The distance between each portion and a vertical reference is also scanned to determine its dimension. The article is rotated about an axis intersecting the predefined plane within the scan of the beam and is axially moved along an axis parallel to the intersecting axis within the scan of the beam so that the dimension of each portion and its distance from the vertical reference can be determined. The apparatus may be used in combination with a cavity identification system to control manufacturing employing multiple molds.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.