Sample cell monitoring system
US4907884A · kind A · utility
34Cited by
5References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 5, 1987 |
| Grant date | Mar 13, 1990 |
| Priority date | — |
| Expiry date | Jun 5, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The light intensity incident on a scattering sample contained in a scattering cell is monitored by simultaneous measurements of the light incident on the cell before entering it and the light transmitted through the cell after leaving it. Means to monitor the product of these signals is disclosed and how this product is related to the actual incident intensity at the sample is explained. The invention is presented in the context of the scattering cell of the parent application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.