Patent · US Expired

Apparatus for testing and sorting electronic components, in particular IC's

US4908126A · kind A · utility

14Cited by

6References

15Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Hans-Heinrich Willberg · Naila, DE
Ekkehard Ueberreiter · Zorneding, DE
Franz Schottler · Großkarolinenfeld, DE

Key dates

Filing date	Nov 10, 1987
Grant date	Mar 13, 1990
Priority date	—
Expiry date	Nov 10, 2007

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB07C5/344
WIPO fieldChemical engineering
WIPO sectorChemistry

Abstract

An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.