Patent · US Expired

Method and apparatus for asynchronous time measurement

US4908784A · kind A · utility

47Cited by
11References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 4, 1987
Grant dateMar 13, 1990
Priority date
Expiry dateAug 4, 2007

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG04F10/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to time measurement apparatus and method for measuring, with picosecond precision, intervals between single edged events, where each measured interval comprises the summation of a rough clock count and fine or calibrated vernier counts of measured fractional clock periods before and after each START and STOP event selected from a calibrated vernier memory. The calibrated vernier memory takes the form of a table of linear voltage versus time developed using pseudo-random generated measurement events of random duration and random separation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.