Method for determining formation characteristics with enhanced statistical precision without degrading the vertical resolution or with enhanced vertical resolution
US4909075A · kind A · utility
17Cited by
11References
71Claims
0Family size
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Key dates
| Filing date | Sep 7, 1989 |
| Grant date | Mar 20, 1990 |
| Priority date | — |
| Expiry date | Sep 7, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/107
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a characteristic of a subsurface geological formation enhances the vertical resolution of dual-detector measurements by utilizing a continuous calibration factor which is obtained from an environmentally compensated characteristic derived from at least two resolution-matched sensor signals, and from a resolution-matched sensor signal from the near-detector of the tool. This method also can enhance the statistical precision of the characteristic without degrading the vertical resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.