System for electrical signal sampling with ultrashort optical pulses
US4910454A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 23, 1989 |
| Grant date | Mar 20, 1990 |
| Priority date | — |
| Expiry date | May 23, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/347
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical signal sampling system uses ultrashort optical pulses (of the order of 10 ps of less) to probe the electrical field from the signal being sampled. The probe is comprised of a modulator in the form of a Fabry-Perot optical interferometer (FP) incorporating a thin film of electro-optic material which may either be an index varying or piezo-electric material. This material, incorporated within the FP and subjected to an electric field, will cause a change in optical transmission characteristic by changing the optical path difference of the FP cavity. The bandwidth for the edge of the transmission window of the FP becomes much greater (by at least approximately 10 times) than the bandwidth of the optical pulses. The thickness or index of the electro-optic material is then adjusted so that the spectrum of the optical pulse falls on one edge (preferably at the 50% transmission point) of the transmission window. The electrical field then changes the optical path (the product of the refractive index and cavity thickness), by either changing the thickness or refractive index of the FP. The electro-optic material is preferably an electro-optic material that exhibits a strong po…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.