Superlattice strain gage
US4912355A · kind A · utility
9Cited by
16References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 28, 1988 |
| Grant date | Mar 27, 1990 |
| Priority date | — |
| Expiry date | Jun 28, 2008 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N30/853
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.