Apparatus for measuring the thickness of an electrically non-conductive material on a metallic base
US4912410A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 29, 1988 |
| Grant date | Mar 27, 1990 |
| Priority date | — |
| Expiry date | Sep 29, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring the thickness of a coating of, for example, paint or other electrically non-conductive material on a metallic base comprises a sensor head housing an electrical measuring coil and supported above the coating on a cushion of air. The air is supplied at a constant predetermined pressure to nozzles carried by the sensor head, and a constant force urging the sensor head towards the surface of the material is yieldably applied to the sensor head through a spring.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.